Forthcoming Institute Conferences

EMAG 2009

Microscopy - the nanoscale and beyond

Introduction

Electron microscopy is currently in a period of rapid technological development, with advances such as aberration correctors, monochromators, developments in focused ion-beam instruments, and new detector technologies opening many new research avenues.  Alongside these come developments in existing techniques and the invention of new techniques.  All these advances are broadening the range of electron microscope application at a time when the ever shrinking dimensions of new technologies require it.

The Electron Microscopy and Analysis Group’s (EMAG) biennial conference has established a strong reputation as a key event in the calendars of the national and international microscopy communities, since its inaugural meeting in 1946 (then known as the Electron Microscopy Group).  It has always sought to capture the latest in the development and applications of electron microscope techniques.

EMAG 2009 will continue this tradition in Sheffield, a city well known for materials development. The central location of Sheffield means that EMAG 2009 will be easily accessible for day visitors as well as for delegates attending the whole conference and the advanced school.

A high quality Trade Exhibition is at the heart of an EMAG conference and EMAG 2009 will build on the success of the Exhibition at Glasgow in 2007 with a mixture of exhibits and technical workshops to enable delegates to interact with vendors and witness the latest developments in microscopy and nanotechnology.

The scientific themes of EMAG 2009 will be addressed through invited and contributed oral and poster presentations. The plenary lectures will be delivered by Professor D J H Cockayne, University of Oxford, Professor D C Joy, University of Tennessee and Professor G Van Tandeloo, University of Antwerp. One of the principal features of the conference is the opportunity it gives to young researchers to present their work through both the symposia and the poster sessions. There will be prizes for the best student contributions.

A one-day advanced school on the subject of Nanofabrication and Nanomanipulation will be held on Tuesday 8 September to enable young researchers to expand their knowledge in a key subject theme of the conference.

The themes of EMAG 2009 will be:

• Advanced electron microscopy techniques;
• Investigating structure-property relationships in advanced materials;
• Nanophysics and nanotechnology.

Oral and poster contributions within any of these themes are invited. These may address topics such as:

• 3-D microscopy
• Aberration corrected microscopy
• Advances in SEM & FIB (CL, EBSD, energy-filters)
• Biological materials
• Catalytic materials
• Detector technologies
• Electron crystallography
• Functional materials
• Geological microscopy
• High spatial resolution chemical and structural analysis
• Imaging dynamic processes
• Interfacial analysis
• In-situ microscopy techniques
• Nano-materials
• Surface imaging and modification
• Structural materials

Further information about abstract submission will be available from January 2009.

Key Dates

Organising Committee:

Conference chair: R T Baker
Programme organiser: P D Nellist
Proceedings editors: D W McComb and R T Baker
Posters organiser: D Ozkaya
Trade exhibition representatives: P Lander, K Meade and CEM
Local and advanced school organisers:G Moebus and T Walther

Enquiries:

Claire Garland
The Institute of Physics
76 Portland Place
London
W1B 1NT, UK

Tel: +44 (0)20 7470 4800
Fax: +44 (0)20 7470 4900
E-mail: claire.garland_AT_iop.org

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